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Recent Articles

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Hitachi High Tech Seeks Patent for Light Source and Automatic Analysis Device

Canon Anelva Awarded Patent for Electric Component, X-Ray Generation Apparatus and X-Ray Imaging Apparatus

Patent Issued for Automatic analysis device (USPTO 11971426)

INTERNATIONAL PATENT: BECTON, DICKINSON AND COMPANY FILES APPLICATION FOR "MULTIPLE LANE EXTRACTION DRAWER"

US Patent Issued to Hitachi High-Tech on May 14 for "Analysis apparatus having a plurality of liquid chromatographs and its analysis method" (Japanese Inventors)

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